Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. On the understanding of positive and negative ionization processes during ToF-SIMS depth profiling by co-sputtering with cesium and xenon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-02
2. Cesium/xenon co-sputtering at different energies during ToF-SIMS depth profiling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-12