Generation and Characterization of Intense Ultralow-Emittance Electron Beams for Compact X-Ray Free-Electron Lasers-Reference-Cited by-同舟云学术

Generation and Characterization of Intense Ultralow-Emittance Electron Beams for Compact X-Ray Free-Electron Lasers

Published:2019-12-06 Issue:23 Volume:123 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Prat E.^ORCID,Dijkstal P.^ORCID,Aiba M.,Bettoni S.^ORCID,Craievich P.^ORCID,Ferrari E.,Ischebeck R.^ORCID,Löhl F.^ORCID,Malyzhenkov A.,Orlandi G. L.^ORCID,Reiche S.,Schietinger T.^ORCID

Funder

Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.123.234801/fulltext

Reference31 articles.

1. X-ray free-electron lasers

2. The physics of x-ray free-electron lasers

3. First lasing and operation of an ångstrom-wavelength free-electron laser

4. A compact X-ray free-electron laser emitting in the sub-ångström region

5. Hard X-ray free-electron laser with femtosecond-scale timing jitter

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