Testing high-resolution transverse profile monitors by measuring the dependence of the electron beam size on the beam energy at SwissFEL

Abstract

Transverse profile monitors are essential devices to characterize particle beams in accelerators. Here, we present an improved design of beam profile monitors at SwissFEL that combines the use of high-quality filters and dynamic focusing. We reconstruct the profile monitor resolution in a gentle way by measuring the electron beam size for different energies. The results show a significant improvement of the new design compared to the previous version, from 20 to 14 µm.