Critical Role of Inelastic Interactions in Quantitative Electron Microscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.100.025503/fulltext
Reference16 articles.
1. Quantitative comparison of high resolution TEM images with image simulations
2. Why don't high‐resolution simulations and images match?
3. Quantifying The Effects Of Amorphous Layers on Image Contrast Using Energy Filtered Transmission Electron Microscopy
4. The phonon contribution to high-resolution electron microscope images
5. Hunting the Stobbs factor
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