Quantifying The Effects Of Amorphous Layers on Image Contrast Using Energy Filtered Transmission Electron Microscopy-Reference-Cited by-同舟云学术

Quantifying The Effects Of Amorphous Layers on Image Contrast Using Energy Filtered Transmission Electron Microscopy

Published:1994 Issue: Volume:354 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Boothroyd C. B.,Dunin-borkowski R. E.,Stobbs W. M.,Humphreys C. J.

Abstract

AbstractHigh resolution images of a block oxide, (Nb205)çi(W03)8, with and without a superposed carbon film are compared both energy filtered and including the inelastic scattering. The differences between the images are quantified on an absolute intensity scale and possible origins of the differences in atomic level contrast are assessed using multislice simulations.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference6 articles.

1. Multiple phase formation in the binary system Nb2O5–WO3. III. The structures of the tetragonal phases W3Nb14O44and W8Nb18O69

2. The contribution of inelastically scattered electrons to high resolution [110] images of AlAs/GaAs heterostructures

3. The contribution of inelastically scattered electrons to high resolution images of (Al, Ga)As/GaAs heterostructures

4. Quantitative high resolution transmission electron microscopy: the need for energy filtering and the advantages of energy-loss imaging

5. Quantitative comparison of high resolution TEM images with image simulations

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Notes and References;Principles of Electron Optics, Volume 4;2022

2. Transmission Electron Microscopy;Springer Tracts in Modern Physics;2018

3. Image formation modeling in cryo-electron microscopy;Journal of Structural Biology;2013-07

4. Developing image-contrast theory and analysis methods in high-resolution electron microscopy;physica status solidi (a);2010-11-04

5. Critical Role of Inelastic Interactions in Quantitative Electron Microscopy;Physical Review Letters;2008-01-17