Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

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Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy

Published:2016-06-17 Issue:24 Volume:116 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

van den Bos Karel H. W.,De Backer Annick,Martinez Gerardo T.,Winckelmans Naomi,Bals Sara,Nellist Peter D.,Van Aert Sandra

Funder

Fonds Wetenschappelijk Onderzoek

European Research Council

Seventh Framework Programme

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.116.246101/fulltext

Reference43 articles.

1. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si

2. Hydrogen production from formic acid decomposition at room temperature using a Ag–Pd core–shell nanocatalyst

3. Pt–Pd Bimetallic Catalysts: Structural and Thermal Stabilities of Core–Shell and Alloyed Nanoparticles

4. Three-dimensional atomic imaging of crystalline nanoparticles

5. Three-Dimensional Atomic Imaging of Colloidal Core–Shell Nanocrystals

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