Top surface layer sensitivity in proton-induced Auger electron spectroscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.70.1279/fulltext
Reference17 articles.
1. Information depth in Auger electron spectroscopy
2. A method for performing angle‐resolved Auger electron spectroscopy using a cylindrical mirror analyzer
3. Nondestructive depth profile study of oxygen‐exposed large‐grain silver using angle‐resolved Auger electron spectroscopy and ion scattering spectroscopy
4. Sensitivity of positron-annihilation-induced Auger-electron spectroscopy to the top surface layer
5. Measurement of positron annihilation induced Auger electron emission from Fe, Cu, Pd, and Au
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