Roughening Rates of Strained-Layer Instabilities
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.94.066101/fulltext
Reference32 articles.
1. Morphological instabilities in thin-film growth and etching
2. Interface morphology development during stress corrosion cracking: Part I. Via surface diffusion
3. On the stability of surfaces of stressed solids
4. SiGe HBTs and HFETs
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