Electronic and Structural Fingerprints of Charge-Density-Wave Excitations in Extreme Ultraviolet Transient Absorption Spectroscopy-Reference-Cited by-同舟云学术

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Electronic and Structural Fingerprints of Charge-Density-Wave Excitations in Extreme Ultraviolet Transient Absorption Spectroscopy

Published:2023-06-07 Issue:2 Volume:13 Page:
ISSN:2160-3308
Container-title:Physical Review X
language:en
Short-container-title:Phys. Rev. X

Author:

Heinrich Tobias^ORCID,Chang Hung-Tzu^ORCID,Zayko Sergey^ORCID,Rossnagel Kai^ORCID,Sivis Murat^ORCID,Ropers Claus^ORCID

Funder

Air Force Office of Scientific Research

Alexander von Humboldt-Stiftung

Max-Planck-Gesellschaft

Georg-August-Universität Göttingen

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevX.13.021033/fulltext

Reference63 articles.

1. Metal-insulator transitions

2. Complexity in Strongly Correlated Electronic Systems

3. Electrodynamics of correlated electron materials

4. Electronic properties and superlattice formation in the semimetalTiSe2

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1. Fast spectroscopic imaging using extreme ultraviolet interferometry;Optics Express;2024-07-25

2. Ultrafast creation of a light-induced semimetallic state in strongly excited 1T-TiSe ₂;Science Advances;2024-05-10

3. Non-thermal phonon dynamics and a quenched exciton condensate probed by surface-sensitive electron diffraction;Nature Materials;2024-04-30

4. Attosecond absorption and reflection spectroscopy of solids;APL Photonics;2024-02-01

5. High-sensitivity extreme-ultraviolet transient absorption spectroscopy enabled by machine learning;Optics Express;2023-11-08

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