Demonstrating Scalable Randomized Benchmarking of Universal Gate Sets-Reference-Cited by-同舟云学术

Demonstrating Scalable Randomized Benchmarking of Universal Gate Sets

Published:2023-11-14 Issue:4 Volume:13 Page:
ISSN:2160-3308
Container-title:Physical Review X
language:en
Short-container-title:Phys. Rev. X

Author:

Hines Jordan^ORCID,Lu Marie,Naik Ravi K.,Hashim Akel,Ville Jean-Loup^ORCID,Mitchell Brad,Kriekebaum John Mark,Santiago David I.^ORCID,Seritan Stefan,Nielsen Erik,Blume-Kohout Robin,Young Kevin,Siddiqi Irfan,Whaley Birgitta,Proctor Timothy^ORCID

Funder

Laboratory Directed Research and Development

Sandia National Laboratories

U.S. Department of Energy

Office of Science

National Nuclear Security Administration

National Quantum Information Science Research Centers

Office of Advanced Scientific Computing Research Quantum

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevX.13.041030/fulltext

Reference49 articles.

1. Gate Set Tomography

2. Experimental Characterization of Crosstalk Errors with Simultaneous Gate Set Tomography

3. Characterization of Addressability by Simultaneous Randomized Benchmarking

4. Detecting crosstalk errors in quantum information processors

5. Direct Randomized Benchmarking for Multiqubit Devices

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