Experimental and theoretical electronic structure determination for PtSi
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.68.045116/fulltext
Reference74 articles.
1. Thermal stability of thin PtSi films on silicon substrates
2. The dependence of Schottky barrier potential on substrate orientation in PtSi infrared diodes
3. Influence of Fermi‐level pinning on barrier height inhomogeneity in PtSi/p‐Si Schottky contacts
4. Conduction mechanism in PtSi/Si Schottky diodes
5. Infrared photoemission of holes from ultrathin (3?20 nm) Pt/Ir-compound silicide films into silicon
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