Electron-induced extended-fine-structure measurements of thin-film growth and reaction
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.36.5941/fulltext
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3. SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY;Surface Review and Letters;1995-02
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