Affiliation:
1. Department of Chemistry and Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada L8S 4M1, Canada
Abstract
Inelastic electron scattering in a reflection geometry is a useful alternative to synchrotron radiation X-ray absorption spectroscopy for inner-shell excitation studies of surfaces. This article reviews the current capabilities of reflection electron energy loss spectroscopy for core-excitation studies of the electronic and geometric structure of surfaces. Issues discussed include: momentum transfer dependence, comparison to X-ray techniques, orientational sensitivity, spatial and energy resolution, and technological applications. Examples of applications to clean surfaces, atomic and molecular adsorbates, and thin films are given.
Publisher
World Scientific Pub Co Pte Lt
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
5 articles.
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