Ballistic-electron-emission-microscopy studies onAu/SiO2/n-type Si(100) andIr/SiO2/n-type Si(100) structures with very thin oxides
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.6623/fulltext
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1. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
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