Light-induced transient currents from molecular films in a tunneling microscope junction-Reference-Cited by-同舟云学术

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Light-induced transient currents from molecular films in a tunneling microscope junction

Published:1999-01-15 Issue:4 Volume:59 Page:3153-3159
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Im Chaiin,Engenhardt Klaus M.,Gregory Stephen

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.59.3153/fulltext

Reference16 articles.

1. Contact electrification

2. Photoemission of Electrons from Silicon into Silicon Dioxide

3. Electron trapping levels in silicon dioxide thermally grown on silicon

4. Photocurent spectroscopy in thin-film insulators: Voltage dependence of the external-circuit current

5. Hot-Electron Transport in Polymeric Dielectrics

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1. Internal Photoemission Spectroscopy Methods;Internal Photoemission Spectroscopy;2014

2. References;Internal Photoemission Spectroscopy;2008

3. Photoassisted scanning tunneling microscopy;Journal of Applied Physics;2002-02-15

4. Surface-plasmon–polariton excitation of optical microcavities and second-harmonic emission;Journal of the Optical Society of America B;2000-04-01

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