Heavy-ion-induced electron emission from thin carbon foils
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.43.2496/fulltext
Reference32 articles.
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4. Target characterization by fast ion impact
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1. Detection efficiency of time-of-flight energy elastic recoil detection analysis systems;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-03
2. Study on emission yields of negative- and positive-ion induced secondary electron from thin SiO2 film;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-05
3. Role of projectile electrons in secondary electron emission from solid surfaces under fast-ion bombardment;Physical Review B;1997-05-01
4. Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils;Physical Review A;1997-02-01
5. Transport of electrons induced by highly charged Ni (74 MeV/u) and Cu (9.6 MeV/u) ions in carbon: A study of target-thickness-dependent electron yields;Physical Review A;1996-11-01
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