Free electron laser stochastic spectroscopy revealing silicon bond softening dynamics-Reference-Cited by-同舟云学术

Free electron laser stochastic spectroscopy revealing silicon bond softening dynamics

Published:2023-06-13 Issue:21 Volume:107 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

De Angelis Dario^ORCID,Principi Emiliano^ORCID,Bencivenga Filippo,Fausti Daniele,Foglia Laura,Klein Yishay,Manfredda Michele,Mincigrucci Riccardo,Montanaro Angela^ORCID,Pedersoli Emanuele^ORCID,Pelli Cresi Jacopo Stefano,Perosa Giovanni^ORCID,Prince Kevin C.^ORCID,Razzoli Elia^ORCID,Shwartz Sharon,Simoncig Alberto,Spampinati Simone,Svetina Cristian^ORCID,Szlachetko Jakub^ORCID,Tripathi Alok,Vartanyants Ivan A.^ORCID,Zangrando Marco,Capotondi Flavio^ORCID

Funder

Narodowe Centrum Nauki

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.107.214305/fulltext

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