π bonding versus electronic-defect generation: An examination of band-gap properties in amorphous carbon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.50.1489/fulltext
Reference39 articles.
1. Compressive-stress-induced formation of thin-film tetrahedral amorphous carbon
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