Electrometry on charge traps with a single-electron transistor
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.67.205313/fulltext
Reference33 articles.
1. On the flicker noise in submicron silicon MOSFETs
2. Observation of single-electron charging effects in small tunnel junctions
3. Noise in the Coulomb blockade electrometer
4. Background charge noise in metallic single-electron tunneling devices
5. Modulation of the charge of a single-electron transistor by distant defects
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