Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.65.193103/fulltext
Reference16 articles.
1. Characterization of semiconductor interfaces by second-harmonic generation
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3. dc-electric-field-induced and low-frequency electromodulation second-harmonic generation spectroscopy ofSi(001)−SiO2interfaces
4. Electron Photoinjection from Silicon to Ultrathin SiO2Films via Ambient Oxygen
5. Coupled Electron-Hole Dynamics at theSi/SiO2Interface
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