Reinvestigation of the Ni/Si interface: Spectromicroscopic evidence for multiple silicide phases-Reference-Cited by-同舟云学术

Reinvestigation of the Ni/Si interface: Spectromicroscopic evidence for multiple silicide phases

Published:1998-03-15 Issue:12 Volume:57 Page:R6799-R6802
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Gregoratti L.,Günther S.,Kovac J.,Casalis L.,Marsi M.,Kiskinova M.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.R6799/fulltext

Reference19 articles.

1. Growth and characterization of epitaxial Ni and Co silicides

2. Bulk versus Surface Transport of Nickel and Cobalt on Silicon

3. Transition metal induced ring‐cluster structures on Si(111)

4. Formation conditions and atomic structure of the Si(111)-√19 Ni surface

5. Growth and annihilation of nickel silicide studied by scanning tunneling microscopy

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