Ab initiostudy of the valence-electron relaxation effect on x-ray-emission spectra and the excitonic effect on electron-energy-loss spectra of the SiL2,3edge-Reference-Cited by-同舟云学术

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Ab initiostudy of the valence-electron relaxation effect on x-ray-emission spectra and the excitonic effect on electron-energy-loss spectra of the SiL2,3edge

Published:1991-12-15 Issue:24 Volume:44 Page:13393-13397
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Ma H.,Lin S. H.,Carpenter R. W.,Sankey O. F.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.44.13393/fulltext

Reference22 articles.

1. Extreme Ultraviolet Transmission of Crystalline and Amorphous Silicon

2. Energy Bands and the Soft-X-Ray Absorption in Si

3. Intensity of Optical Absorption by Excitons

4. Core Excitons and the Soft-X-Ray Threshold of Silicon

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Lead Phthalocyanine Films by Near Edge X-ray Absorption Fine Structure Spectroscopy;The Journal of Physical Chemistry C;2007-07-26

2. Experimental imaging of silicon nanotubes;Applied Physics Letters;2005-06-06

3. Comparison of the size of excitonic effects in molecular π systems as measured by core and valence spectroscopies;Chemical Physics;2005-06

4. Hall and photocapacitance analyses of the Sb-related electron trap in GaAs1-xSbx(x⩽0.02) layers grown by liquid phase epitaxy;Semiconductor Science and Technology;2000-05-24

5. Theoretical and experimental study of the graphite 1sx-ray absorption edges;Physical Review B;1996-11-15

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