Structure of cleavage steps on Si(111)
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.42.8982/fulltext
Reference18 articles.
1. Step-formation energies and domain orientations at Si(111) surfaces
2. Theory of semiconductor surface reconstruction: Si(111)-7×7, Si(111)-2×1, and GaAs(110)
3. Theoretical study of the atomic structure of silicon (211), (311), and (331) surfaces
4. The roughness of cleaved semiconductor surfaces
5. Structural and Electronic Properties of Stepped Semiconductor Surfaces
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Cleavage Processes and Steps in Semiconductors;Springer Proceedings in Physics;1993
2. Total-energy calculations of semiconductor surface reconstructions;Surface Science Reports;1992-09
3. Comparative study of silicon empirical interatomic potentials;Physical Review B;1992-07-15
4. Strain-energy calculations of surface and step structures on silicon (111);Surface Science;1992-07
5. Light emission from Si cleaved and gas-covered surfaces;Applied Surface Science;1991-01
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