Metal-insulator transition in amorphousSi1−xNix:Evidence for Mott’s minimum metallic conductivity-Reference-Cited by-同舟云学术

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Metal-insulator transition in amorphousSi1−xNix:Evidence for Mott’s minimum metallic conductivity

Published:1999-11-15 Issue:20 Volume:60 Page:14209-14223
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Möbius A.,Frenzel C.,Thielsch R.,Rosenbaum R.,Adkins C. J.,Schreiber M.,Bauer H.-D.,Grötzschel R.,Hoffmann V.,Krieg T.,Matz N.,Vinzelberg H.,Witcomb M.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.60.14209/fulltext

Reference79 articles.

1. Absence of Diffusion in Certain Random Lattices

2. Conduction in non-crystalline systems IX. the minimum metallic conductivity

3. Scaling Theory of Localization: Absence of Quantum Diffusion in Two Dimensions

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