X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.55.1793/fulltext
Reference25 articles.
1. Defects in epitaxial multilayers
2. Depth‐dependent imaging of dislocations in heteroepitaxial layers
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4. High-resolution X-ray topography
5. X-ray diffraction from low-dimensional structures
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