Surface roughness at the Si(100)-SiO2interface
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.32.8171/fulltext
Reference33 articles.
1. Electronic properties of two-dimensional systems
2. Valley splitting and related phenomena in si inversion layers
3. Surface-irregularity-enhanced subband resonance of semiconductors. I. General theory
4. An Auger analysis of the SiO2‐Si interface
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