Statistics of ion-induced kinetic electron emission: A comparison between experimental and Monte Carlo–simulated results

Author:

Ohya K.,Aumayr F.,Winter H.

Publisher

American Physical Society (APS)

Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Number distribution of emitted electrons by MeV H+ impact on carbon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09

2. Review Article: Advanced nanoscale patterning and material synthesis with gas field helium and neon ion beams;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2017-05

3. Characterization of secondary ion emission processes of sub-MeV C60 ion impacts via analysis of statistical distributions of the emitted ion number;The Journal of Chemical Physics;2016-12-20

4. Investigation of trapped metallo-dielectric core–shell colloidal particles using soft X-rays;Journal of Electron Spectroscopy and Related Phenomena;2008-11

5. Emission statistics of X-ray induced photoelectrons and its comparison with electron- and ion-induced electron emissions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-02

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