Atomic geometry of Ge(111) √3 × √3R30°-Ag determined by low-energy electron diffraction
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.49.13483/fulltext
Reference36 articles.
1. Physics and electronics of the noble-metal/elemental-semiconductor interface formation: A status report
2. The structure of Si(111)-()R30°-Ag determined by surface X-ray diffraction
3. Study on the Si(111)$ \sqrt{3}{\times}\sqrt{3}$-Ag Surface Structure by X-Ray Diffraction
4. Rheed intensity analysis of Si(111)√3×√3-Ag structure
5. Structure analysis of Si(111)-(√3 × √3 )R30°/Ag using x-ray standing waves
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