Structure analysis of Si(111)-(√3 × √3 )R30°/Ag using x-ray standing waves
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.43.7185/fulltext
Reference38 articles.
1. Investigation of the initial stages of growth of Ag films on Si(111)7 × 7 by a combination of LEED, AES, and UPS
2. The structural and electronic properties of cleaved silicon (111) surfaces following adsorption of silver
3. Initial growth process and surface structure of Ag on Si(111) studied by low-energy Ion-Scattering Spectroscopy (ISS) and LEED-AES
4. Nucleation, growth and the intermediate layer in Ag/Si(100) and Ag/Si(111)
5. Surface structure study of by incident beam rocking AES method
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2. A Scanning Tunneling Microscopy Study of Distyrylbenzene on Ag/Ge(111)-( × )R30°;Langmuir;2007-10-31
3. Surface structure determination using x-ray standing waves;Reports on Progress in Physics;2005-03-09
4. Order-disorder phase transition of Si(111)-.RAD.3*.RAD.3-Ag surface studied by reflection high-energy positron diffraction;e-Journal of Surface Science and Nanotechnology;2005
5. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06
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