Resonant Raman scattering in an InSb/In1−xAlxSb strained-layer superlattice and inIn1−xAlxSb epilayers on InSb
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.11234/fulltext
Reference34 articles.
1. Raman spectroscopy—A versatile tool for characterization of thin films and heterostructures of GaAs and AlxGa1−xAs
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3. Observation of Superlattice Effects on the Electronic Bands of Multilayer Heterostructures
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