Shallow and deep impurity levels in multivalley semiconductors: A Green-function study of silicon by the recursion method
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.40.8410/fulltext
Reference35 articles.
1. Shallow and deep impurity levels in multivalley semiconductors: A Green-function study of a cubic model by the recursion method
2. A Semi-empirical tight-binding theory of the electronic structure of semiconductors†
3. Theory of Substitutional Deep Traps in Covalent Semiconductors
4. Theoretical study of native defects in III-V semiconductors
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