Optical transitions in strained Ge/Si superlattices
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.45.6793/fulltext
Reference30 articles.
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4. Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures
5. Interband transitions of thin-layer GaAs/AlAs superlattices
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