Atomic-scale dielectric permittivity profiles in slabs and multilayers
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.74.045318/fulltext
Reference43 articles.
1. High-κ gate dielectrics: Current status and materials properties considerations
2. Alternative dielectrics to silicon dioxide for memory and logic devices
3. Polymer/layered silicate nanocomposites: a review from preparation to processing
4. Material characterization of a high-dielectric-constant polymer-ceramic composite for embedded capacitor for RF applications
5. Synthesis of Monodisperse Nanoparticles of Barium Titanate: Toward a Generalized Strategy of Oxide Nanoparticle Synthesis
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