Structural study of porous silicon and its oxidized states by solid-state high-resolution29SiNMR spectroscopy-Reference-Cited by-同舟云学术

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Structural study of porous silicon and its oxidized states by solid-state high-resolution29SiNMR spectroscopy

Published:1998-11-15 Issue:20 Volume:58 Page:13863-13869
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Tsuboi Takashi,Sakka Tetsuo,Ogata Yukio H.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.58.13863/fulltext

Reference37 articles.

1. Electrolytic Shaping of Germanium and Silicon

2. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

3. Electroluminescence in the visible range during anodic oxidation of porous silicon films

4. X-ray topographic characterization of porous silicon layers

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