X-ray topographic characterization of porous silicon layers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference22 articles.
1. The n+-IPOS scheme and its applications to IC's
2. A new dielectric isolation method using porous silicon
3. Electrolytic Shaping of Germanium and Silicon
4. Electropolishing Silicon in Hydrofluoric Acid Solutions
5. Formation and Properties of Porous Silicon and Its Application
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