Microstructure and hydrogen dynamics in hydrogenated amorphous silicon carbides
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.60.15875/fulltext
Reference48 articles.
1. Electron diffraction analysis of the growth of hydrogenated amorphous silicon thin films
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4. The structure of a-Si:H by small angle x-ray scattering
5. Medium-Range Order of Amorphous Silicon Germanium Alloys: Small-Angle X-Ray Scattering Study
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2. GISAXS and GIWAXS analysis of amorphous–nanocrystalline silicon thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-02
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