Study of amorphous nanocrystalline thin silicon films by grazing-incidence small-angle X-ray scattering-Reference-Cited by-同舟云学术

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Study of amorphous nanocrystalline thin silicon films by grazing-incidence small-angle X-ray scattering

Published:2007-02-09 Issue:s1 Volume:40 Page:s373-s376
ISSN:0021-8898
Container-title:Journal of Applied Crystallography
language:
Short-container-title:J Appl Cryst

Author:

Gracin Davor,Bernstorff Sigrid,Dubcek Pavo,Gajovic Andreja,Juraic Krunoslav

Publisher

International Union of Crystallography (IUCr)

Subject

General Biochemistry, Genetics and Molecular Biology

Link

http://journals.iucr.org/j/issues/2007/s1/00/aj6022/aj6022.pdf

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of amorphous-nanocrystalline silicon thin films by time-of-flight elastic recoil detection analysis and high-resolution electron microscopy;Applied Surface Science;2013-06

2. Structural analysis of amorphous-nanocrystalline silicon thin films by grazing incidence X-ray diffraction;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-08

3. Amorphous-Nano-Crystalline Silicon Thin Films in Next Generation of Solar Cells;Physics Procedia;2012

4. Size-Dependent Reactivity in Hydrosilylation of Silicon Nanocrystals;Journal of the American Chemical Society;2011-05-27

5. Alkyl Passivation and Amphiphilic Polymer Coating of Silicon Nanocrystals for Diagnostic Imaging;Small;2010-09-03

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