Depth-resolved chemical speciation of a W-B4C multilayer structure-Reference-Cited by-同舟云学术

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Depth-resolved chemical speciation of a W-B4C multilayer structure

Published:2017-10-24 Issue:15 Volume:96 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Das Gangadhar,Karydas A. G.,Ghosh Haranath,Czyzycki M.,Migliori A.,Sinha A. K.,Tiwari M. K.

Funder

European Synchrotron Radiation Facility

International Atomic Energy Agency

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.96.155444/fulltext

Reference60 articles.

1. Orbital Reconstruction and Covalent Bonding at an Oxide Interface

2. Why some interfaces cannot be sharp

3. Orbital reflectometry of oxide heterostructures

4. Strain-Induced Insulator State and Giant Gauge Factor ofLa0.7Sr0.3CoO3Films

5. Spin, Orbital, and Charge Order at the Interface between Correlated Oxides

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1. X‐ray standing wave assisted XANES for depth dependent chemical state analysis of Cr in Cr₂O₃/Cr bilayer structure;Surface and Interface Analysis;2024-07-17

2. Non-destructive elemental depth profiling of Ni/Ti multilayers by GIXRF technique;Applied Surface Science;2021-03

3. Surface‐interface investigations of an ultrathin pulsed laser deposited NiO/ZnO bilayer structure;Surface and Interface Analysis;2020-05-19

4. A mathematical model for deep ion implantation depth profiling by synchrotron radiation grazing-incidence X-ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2020

5. Effect of argon-nitrogen mixed ambient Ni sputtering on the interface diffusion of Ni/Ti periodic multilayers and supermirrors;Vacuum;2019-11

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