Energy dissipation unveils atomic displacement in the noncontact atomic force microscopy imaging of Si(111)−(7×7)
Author:
Funder
Japan Society for the Promotion of Science
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.97.115428/fulltext
Reference39 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Noncontact Atomic Force Microscopy
3. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods
4. Atomic resolution non-contact atomic force microscopy of clean metal oxide surfaces
5. Noncontact Atomic Force Microscopy
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1. Energy dissipation of a carbon monoxide molecule manipulated using a metallic tip on copper surfaces;Physical Review B;2023-10-02
2. Measurement of distribution of charge adsorbed on Au<i><sub>x</sub></i>/Si(111)-7×7 surface on an atomic scale in ultra-high vacuum;Acta Physica Sinica;2023
3. Mechanical energy dissipation of an oscillating cantilever close to a conductive substrate partly covered with thin mica films evaluated by frequency modulation atomic force microscopy;Japanese Journal of Applied Physics;2022-05-27
4. Critical shear stress of gold nanocontacts estimated by in situ transmission electron microscopy equipped with a quartz length-extension resonator;Applied Physics Express;2021-06-23
5. Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy;Beilstein Journal of Nanotechnology;2020-03-10
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