Efficient p -type doping of sputter-deposited NiO thin films with Li, Ag, and Cu acceptors-Reference-Cited by-同舟云学术

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Efficient p -type doping of sputter-deposited NiO thin films with Li, Ag, and Cu acceptors

Published:2020-10-20 Issue:10 Volume:4 Page:
ISSN:2475-9953
Container-title:Physical Review Materials
language:en
Short-container-title:Phys. Rev. Materials

Author:

Egbo Kingsley O.^ORCID,Ekuma Chinedu E.^ORCID,Liu Chao Ping^ORCID,Yu Kin Man^ORCID

Funder

Research Grants Council, University Grants Committee

Shantou University

Applied Basic Research Foundation of Yunnan Province

National Natural Science Foundation of China

Publisher

American Physical Society (APS)

Subject

Physics and Astronomy (miscellaneous),General Materials Science

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.4.104603/fulltext

Reference48 articles.

1. P-type transparent conducting oxides

2. Transparent Conducting Oxides

3. Transparent Conducting Oxides—An Up-To-Date Overview

4. Engineering Valence Band Dispersion for High Mobility p-Type Semiconductors

5. Identification and design principles of low hole effective mass p-type transparent conducting oxides

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1. Impact of zinc concentration and annealing temperature on the structural, optical, and photoelectrochemical properties of nickel oxide thin films synthesized by electrodeposition method;Journal of Alloys and Compounds;2024-10

2. High temperature ferrimagnetic semiconductors by spin-dependent doping in high temperature antiferromagnets;npj Computational Materials;2024-09-03

3. Cu-doped NiO thin film's structural, optical, and electrical properties and its negative absorption behaviour in the Infra-Red region;Physica B: Condensed Matter;2024-09

4. Structural, vibrational, magnetic, and X-ray absorption study on (Li, Zn)-doped NiO nanoparticles;Journal of Materials Science: Materials in Electronics;2024-08

5. Universal strain engineering for enhancing the hole mobility and dopability in p-type semiconductors;Journal of Applied Physics;2024-07-02

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