Determination of indium content of GaAs/(In,Ga)As/(GaAs) core-shell(-shell) nanowires by x-ray diffraction and nano x-ray fluorescence-Reference-Cited by-同舟云学术

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Determination of indium content of GaAs/(In,Ga)As/(GaAs) core-shell(-shell) nanowires by x-ray diffraction and nano x-ray fluorescence

Published:2018-01-19 Issue:1 Volume:2 Page:
ISSN:2475-9953
Container-title:Physical Review Materials
language:en
Short-container-title:Phys. Rev. Materials

Author:

Al Hassan Ali,Lewis R. B.,Küpers H.,Lin W.-H.,Bahrami D.,Krause T.,Salomon D.,Tahraoui A.,Hanke M.,Geelhaar L.,Pietsch U.

Funder

Delta

Deutsche Forschungsgemeinschaft

Alexander von Humboldt-Stiftung

Publisher

American Physical Society (APS)

Subject

Physics and Astronomy (miscellaneous),General Materials Science

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.2.014604/fulltext

Reference43 articles.

1. 25th Anniversary Article: Semiconductor Nanowires - Synthesis, Characterization, and Applications

2. Nanowire photonics

3. III–V nanowires and nanowire optoelectronic devices

4. Nanowire electronic and optoelectronic devices

5. Light Trapping in Silicon Nanowire Solar Cells

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