Step by step analysis toward optimal MTF algorithm using an edge test device-Reference-Cited by-同舟云学术

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Step by step analysis toward optimal MTF algorithm using an edge test device

Published:2009 Issue:1 Volume:17 Page:1-15
ISSN:0895-3996
Container-title:Journal of X-Ray Science and Technology
language:
Short-container-title:

Author:

Donovan Molly¹,Zhang Da¹,Liu Hong¹

Affiliation:

1. Center for Bioengineering and School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019, USA

Publisher

IOS Press

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiology, Nuclear Medicine and imaging,Instrumentation,Radiation

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on a DS-class X-ray film digitisation device and an image enhancement algorithm with 12-bit RAW data;Insight - Non-Destructive Testing and Condition Monitoring;2023-06-01

2. Modulation transfer function (MTF) evaluation for x-ray phase imaging system employing attenuation masks;Physics in Medicine & Biology;2023-04-24

3. The Effect of a Diverse Dataset for Transfer Learning in Thermal Person Detection;Sensors;2020-04-02

4. Tutorial on X-ray photon counting detector characterization;Journal of X-Ray Science and Technology;2018-02-23

5. Error of the slanted edge method for measuring the modulation transfer function of imaging systems;Applied Optics;2018-01-19

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