Advanced atomic force microscopy techniques-Reference-Cited by-同舟云学术

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Advanced atomic force microscopy techniques

Published:2012-12-21 Issue: Volume:3 Page:893-894
ISSN:2190-4286
Container-title:Beilstein Journal of Nanotechnology
language:en
Short-container-title:Beilstein J. Nanotechnol.

Author:

Glatzel Thilo,Hölscher Hendrik,Schimmel Thomas,Baykara Mehmet Z,Schwarz Udo D,Garcia Ricardo

Publisher

Beilstein Institut

Subject

Electrical and Electronic Engineering,General Physics and Astronomy,General Materials Science

Link

https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-3-99.pdf

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