Characterization Techniques for Topography Analysis
Author:
Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-9569-8_3
Reference50 articles.
1. T. Glatzel et al., Advanced atomic force microscopy techniques. Biophys. Rev. 12(4), 893–894 (2012). https://doi.org/10.1002/jmr.857
2. T. Glatzel, H. Hölscher, T. Schimmel, M.Z. Baykara, U.D. Schwarz, R. Garcia, Advanced atomic force microscopy techniques. Beilstein J. Nanotechnol. 3(1), 893–894 (2012). https://doi.org/10.3762/bjnano.3.99
3. Y.F. Dufrêne et al., Imaging modes of atomic force microscopy for application in molecular and cell biology. Nat. Nanotechnol. 12(4), 295–307 (2017). https://doi.org/10.1038/nnano.2017.45
4. P. Parot et al., Past, present and future of atomic force microscopy in life sciences and medicine. J. Mol. Recognit. 20(6), 418–431 (2007). https://doi.org/10.1002/jmr.857
5. B. Prats-Mateu, N. Gierlinger, Tip in–light on: Advantages, challenges, and applications of combining AFM and Raman microscopy on biological samples. Microsc. Res. Tech. 80(1), 30–40 (2017). https://doi.org/10.1002/jemt.22744
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