Focused particle beam-induced processing
Author:
Publisher
Beilstein Institut
Subject
Electrical and Electronic Engineering,General Physics and Astronomy,General Materials Science
Link
https://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-6-191.pdf
Reference17 articles.
1. The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors
2. Continuum models of focused electron beam induced processing
3. Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments
4. Electron-stimulated purification of platinum nanostructures grown via focused electron beam induced deposition
5. Formation of pure Cu nanocrystals upon post-growth annealing of Cu–C material obtained from focused electron beam induced deposition: comparison of different methods
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1. Fragmentation of metal(II) bis(acetylacetonate) complexes induced by slow electrons;Beilstein Journal of Nanotechnology;2023-09-26
2. Fast and Efficient Simulation of the FEBID Process with Thermal Effects;Nanomaterials;2023-02-25
3. Interaction of Slow Electrons with Thermally Evaporated Manganese(II) Acetylacetonate Complexes;The Journal of Physical Chemistry A;2020-03-06
4. Decomposition of Iron Pentacarbonyl Induced by Singly and Multiply Charged Ions and Implications for Focused Ion Beam-Induced Deposition;The Journal of Physical Chemistry C;2019-03-27
5. Helium Ion Microscopy for Two-Dimensional Materials;Helium Ion Microscopy;2016
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