Atomic-scale characterization of structural heterogeny in 2D TMD layers-Reference-Cited by-同舟云学术

Atomic-scale characterization of structural heterogeny in 2D TMD layers

Published:2022 Issue:3 Volume:3 Page:1401-1414
ISSN:2633-5409
Container-title:Materials Advances
language:en
Short-container-title:Mater. Adv.

Author:

Li Hao¹,Yoo Changhyeon¹^ORCID,Ko Tae-Jun¹^ORCID,Kim Jung Han²^ORCID,Jung Yeonwoong¹³⁴^ORCID

Affiliation:

1. NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA

2. Department of Materials Science and Engineering, Dong-A University, Busan 49315, South Korea

3. Department of Electrical and Computer Engineering, University of Central Florida, Orlando, Florida 32816, USA

4. Department of Materials Science and Engineering, University of Central Florida, Orlando, Florida 32826, USA

Abstract

Recent progress in atomic-scale TEM characterization of structural heterogeny in 2D TMD layers is overviewed. The prospects of visualization techniques are assessed toward atomic-scale identification and manipulation of defects and heterointerfaces.

Funder

University of Central Florida

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science,Chemistry (miscellaneous)

Link

http://pubs.rsc.org/en/content/articlepdf/2022/MA/D1MA01013A

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