Fast, quantitative and high resolution mapping of viscoelastic properties with bimodal AFM-Reference-Cited by-同舟云学术

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Fast, quantitative and high resolution mapping of viscoelastic properties with bimodal AFM

Published:2019 Issue:32 Volume:11 Page:15289-15297
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Benaglia Simone¹²³⁴⁵,Amo Carlos A.¹²³⁴⁵,Garcia Ricardo¹²³⁴⁵^ORCID

Affiliation:

1. Material Science Factory

2. Instituto de Ciencia de Materiales de Madrid

3. CSIC

4. 28049 Madrid

5. Spain

Abstract

Quantitative mapping of viscoelastic properties of soft matter with a nanoscale spatial resolution is demonstrated by bimodal AFM.

Funder

FP7 Ideas: European Research Council

Ministerio de Economía y Competitividad

H2020 Marie Skłodowska-Curie Actions

Ministerio de Educación, Cultura y Deporte

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2019/NR/C9NR04396A

Reference64 articles.

1. Probing of Polymer Surfaces in the Viscoelastic Regime

2. Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model

3. Elastic and viscoelastic characterization of inhomogeneous polymers by bimodal atomic force microscopy

4. Practical loss tangent imaging with amplitude-modulated atomic force microscopy

5. Analytical model of atomic-force-microscopy force curves in viscoelastic materials exhibiting power law relaxation

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