Practical loss tangent imaging with amplitude-modulated atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4944879
Reference51 articles.
1. Atomic Force Microscope
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4. Atomic Force Microscopy: General Principles and a New Implementation
5. Bistable behavior of a vibrating tip near a solid surface
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