Effect of UV radiation damage in air on polymer film thickness, studied by soft X-ray spectromicroscopy
Author:
Affiliation:
1. Dept. Chemistry and Chemical Biology
2. McMaster University
3. Hamilton
4. Canada
5. Automotive Fuel Cell Corporation Corp.
6. Burnaby
Abstract
The thicknesses of thin films of polystyrene (PS), poly(methyl methacrylate) (PMMA), and perfluorosulfonic acid (PFSA) were measured by Ultraviolet Spectral Reflectance (UV-SR) and Scanning Transmission X-ray Microscopy (STXM).
Funder
Natural Sciences and Engineering Research Council of Canada
Publisher
Royal Society of Chemistry (RSC)
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://pubs.rsc.org/en/content/articlepdf/2018/CP/C7CP08621K
Reference57 articles.
1. STXM Characterization of PEM Fuel Cell Catalyst Layers
2. STXM Study of the Ionomer Distribution in the PEM Fuel Cell Catalyst Layers
3. NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space
4. Quantitative Mapping of Structured Polymeric Systems Using Singular Value Decomposition Analysis of Soft X-ray Images
5. Thickness of Spin-Cast Polymer Thin Films Determined by Angle-Resolved XPS and AFM Tip-Scratch Methods
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Both nanoplastic and iron mineral types determine their heteroaggregation: Aggregation kinetics and interface process;Journal of Hazardous Materials;2024-05
2. Stable chemical enhancement of passivating nanolayer structures grown by atomic layer deposition on silicon;Nanoscale;2023
3. Bioactive Electrospun Fibers: Fabrication Strategies and a Critical Review of Surface-Sensitive Characterization and Quantification;Chemical Reviews;2021-02-19
4. Application of microprobe soft X-ray fluorescence and absorption spectroscopic analyses to characterize the buried multi-layered micro-structure;Japanese Journal of Applied Physics;2020-05-29
5. Solar Hydrogen Generation from Ambient Humidity Using Functionalized Porous Photoanodes;ACS Applied Materials & Interfaces;2019-10-11
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3