Total reflection X-ray fluorescence—an efficient method for micro-, trace and surface layer analysis. Invited lecture
Author:
Publisher
Royal Society of Chemistry (RSC)
Subject
Spectroscopy,Analytical Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/1992/JA/JA9920700273
Reference51 articles.
1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis
2. A method for quantitative X-ray fluorescence analysis in the nanogram region
3. Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amounts
4. An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level
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